The Effect of Deposition Angle and film width on some Electrical Properties of (SnTe) Films Prepared by Thermal Evaporation

Abstract

ABSTRACT
In this research had been studied the Tin Telluride films deposited at angels θ = (0 ̊ , 45° , 70 ̊ ) by thermal evaporation method at a pressure of 10-6 torr on glass substrates at room temperature. Films thickness t =(350 ± 10) nm and films width ( 3 mm , 4 mm , 5 mm ) . The conductivity decreases with increasing deposition angles and films width. The Seebeck Coefficient increases with increasing deposition angles and films width.
Keywords: Thin films , Films width , SnTe thin films , Obliquely Deposited, D.C conductivity, Seebeck Coefficient