Studying the Structural and Optical Properties of AgO70%:In30% Thin Films Prepared by Thermal Vacuum Evaporation Technique

Abstract

Thin films of (AgO70%:In30%) have been prepared on glass substrates under a vacuum ~10-4 Torr by the Thermal Vacuum Evaporation technique. Thickness of the films varied between (50-100) nm. The surface morphology and crystal structure were investigated by X-ray diffraction (XRD). The optical properties also investigated by UV- spectrometer, Atomic Force Microscopy (AFM) and Optical Microscopy respectively. The X-ray diffraction (XRD) analysis reveals the peaks at (012) (1̅12) and (222) plans Which confirm that the prepared films are AgO70%:In30%. Transmittance and absorption data in range of wavelength (320 – 1100) nm have been used to calculate the optical constants for the prepared films, and this optical results showed that AgO70%:In30% films has a band gap of 3. 5 eV. The AFM technique showed that the grain size of particle for AgO70%:In30% thin films was 46.2 nm.