(Bi2O ????? ????? ??? ??????? ????????? ???????? ??????? ??????

Abstract

In this research , the influence of different thickness (250,350 and 450 ±20 nm) on the structural and optical properties have been investigated on the thin films of (Bi2O3) which deposited on glass substrates using thermal evaporation technique under vacuum , ( XRD) is used to characterize the structural properties, the results indicate that all films prepared have polycrystalline structure with preferentially oriented in the [ 201] with tetragonal structure, The optical analyses shows that these films have high absorption coefficient ( ? > 104 cm-1 ) and direct energy gap which increase with the increase of film thickness , Also optical measurements shows that , the values of absorption coefficient , refractive index , extinction coefficient , the dielectric constants with both parts real and imaginary Optical Conductivity are change with on film thickness for the wavelength in the range ( 300 – 1100 nm ) .